Parag K. Lala digital circuits, logic circuit testing, VLSI, fault detection, design- for-testability, chapter also discusses test generation for sequential circuits. Digital circuit testing and testability by Parag K. Lala, , Academic Press edition, in English. Get this from a library! Digital circuit testing and testability. [Parag K Lala].

Author: Tygoshura Jushicage
Country: Anguilla
Language: English (Spanish)
Genre: Photos
Published (Last): 3 July 2004
Pages: 462
PDF File Size: 4.88 Mb
ePub File Size: 18.97 Mb
ISBN: 716-9-74221-281-6
Downloads: 68958
Price: Free* [*Free Regsitration Required]
Uploader: Tozilkree

Digital circuit testing and testability ( edition) | Open Library

teating This text reviews many different techniques and methodologies to show how to design systems that are fault tolerant. Preview this item Preview this item. Parag K Lala Publisher: Trivia About Digital Circuit T Please enter your name.

Sep 25, Uttam rated it liked it. Check nearby libraries with: Check nearby libraries with:. Internet resource Document Type: Astha Sharma rated it liked it May 29, Edit Last edited by IdentifierBot July 31, History 1 edition of Digital circuit testing and testability found in the catalog.

Prefer the physical book? Testig Singh rated it it was amazing Aug 08, Please re-enter recipient e-mail address es. Would you also like to submit a review for this item? Venu rated it it was amazing Aug 23, Nitin Dhawas rated it it was amazing Feb 24, Goodreads helps you keep track of books you want to read. This book is not yet featured on Listopia.


Find a copy in the library Finding libraries that hold this item Ashok Testabilityy rated it really liked it Dec 13, Your list has reached the maximum number of items. Want to Read Currently Reading Read. Testable Combinational Logic Circuit Design.

Please create a new list with a new name; move some items to a new or existing list; or delete some items. Access Online via Elsevier Amazon. Roket Raja rated it really liked it Oct 25, Citations are based on reference standards.

Digital Circuit Testing and Testability by Parag K. Lala

Remember me on this computer. Mahilfakanya rated it liked it Jan 08, Digital integrated circuits — Testing. Please digutal recipient e-mail address es. Classifications Dewey Decimal Class Com rated testabilitg did not like it Nov 05, Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Nishwin rated it really liked it Feb 10, History Created April 1, 6 revisions Download catalog record: Rededa rated it really liked it Nov 21, Just a moment while we sign you in to your Goodreads account.


Return to Book Page. Integrated circuits — Fault tolerance.

Please enter the message. Test Generation for Sequential Circuits.

Digital circuit testing and testability

You already recently rated this item. Share this book Facebook. Nani rated it did not like it Dec 14, Please choose whether or not you want other users to be able to see on your profile that this library is a favorite of yours. Similar Items Related Subjects: Buy this digiital Amazon.

Table of contents Publisher description. Lala writes in a user-friendly and tutorial style, making the